Valydate Technology has been applied to wide spectrum of products. These applications have been fully screened using Valydate’s Schematic Integrity capability, leading to the following key results.
The metrics indicate the effectiveness of the technology at removing defects that could otherwise escape to the field, impacting clients’ overall R&D effectiveness and general business performance.
The Valydate Average Defect Discovery rate illustrates the average number of findings discovered on projects executed over a 3 month period.
On a per-PCB basis, greater than 50 defects have been reported on average.
The range of defects discovered was 24 (min) to 181 (max).
The number of average defects requiring artwork adjustment discovered was 5.3.
The number of defects in multi-board projects discovered was on average of 72.3.
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The general trend reveals that the number of defects discovered is higher as the complexity of the unit increases, Valydate technology is effective at discovering defects on all tested boards. |
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| Figure 2: Defect count vs. Board Complexity |
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Critical Findings are those with confirmed impact requiring artwork recycle or which would cause product failure. Valydate discovered an average of 3.8 critical defects/ board, and 5.4 critical defects per multi-board project. |
| Figure 3: Critical Average Defect Discovery Rate |
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Regardless of Board Complexity, Valydate technology is discovering critical defects on every board tested to date. Even small schematics at < 1,000 nets benefit from Valydate’s technology application. |
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| Figure 4: Critical defect rate vs Complexity |
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